Extreme ultraviolet lithography (EUVL) technology is a key technical path to advance semiconductor manufacturing processes towards more advanced processes. The current mainstream LPP-EUV light source system bombards tin plasma with 10.6-micron wavelength infrared laser (IR) to generate extreme ultraviolet radiation, which is focused to the intermediate focus (IF) position by a collecting mirror. However, if the residual infrared radiation in the system enters the exposure optical system, it will generate unnecessary heat load, which will affect the stability and exposure quality of the lithography system. Therefore, effectively suppressing infrared radiation is crucial to ensuring the performance of the lithography machine.
Currently, the industry usually integrates spectral purification filter structures (SPFs) on the surface of EUV collection mirrors to filter infrared radiation energy, but the existing evaluation method only relies on the single physical quantity of diffraction efficiency to evaluate the suppression effect, which lacks comprehensiveness.
A researcher at the Institute of Microelectronics, Chinese Academy of Sciences, has made a breakthrough in this field. The team proposed a theoretical model of infrared suppression ratio (IRSR) based on linear radiation flux density. This model can integrate and reduce the dimension of the infrared radiation flux of the collector mirror, effectively integrating multiple key factors such as the energy distribution of the light source, the geometric shape of the collector mirror, the reflection characteristics of the multilayer film, and the grating diffraction efficiency, and realizes the precise analysis of the contribution mechanism and quantitative weight of each factor to the local and global IRSR of the collector mirror.

Compared with the existing evaluation methods that only rely on a single physical quantity, this model introduces a multivariate comprehensive analysis framework, which confirms that the global IRSR is actually the weighted harmonic mean integral of the local IRSR, where the weight function is the linear radiation flux density on the collector surface. This research has laid a solid theoretical foundation for the coordinated optimization of the collector and SPF and the precise measurement of IRSR.

The relevant research results were published in the optics journal Optics Express under the title "Modeling and evaluation for the infrared suppression ratio of an EUV collector with integrated spectral purity filters". Jin Hao, a doctoral student at the Institute of Microelectronics, is the first author of the paper, and Qi Yuejing, a researcher, is the corresponding author. The research was supported by the Strategic Priority Research Program of the Chinese Academy of Science